A CONFIG is an ASCII file containing the settings of CGS4 and the data acquisition parameters. In order to set up the spectrometer the following parameters must be specified: the grating to be used, the central wavelength of the spectrum in microns, the order to use the grating in (unless echelle_auto_order was selected as grating), the CVF offset in microns, the slit width and its position angle and the sampling required for the observations. The data acquisition parameters to be specified in a CONFIG are: the data acquisition mode, the on-chip exposure time in seconds, the number of exposures to be co-added into an integration and the number of integrations per detector sampling position. A typical CONFIG, called TARGET, used to observe a target object is:
ASTRONOMICAL configuration : TARGET
Basic (object) configuration:
ND_STARE Acquisition configuration
30.0000 exposure time
1 exposures/integ
1 scans
4 sampling
2_pixels sample range
-90.00 position angle
N4 filter
1_pixel slit width
echelle_auto_order grating
1.2822 wavelength
1 order
0.0000 cvf offset
off calibration lamp
97 tungsten-halogen level
10 lamp effective aperture
Flat configuration variant (from object):
1x1 Flat sampling
5.0 calibration lamp
ND_STARE Acquisition configuration
1.0000 exposure time
10 exposures/integ
3 integrations
Dark configuration variant (from object):
1 exposures/integ
1 integrations
Bias configuration variant (from dark):
0.1200 exposure time
50 exposures/integ
3 integrations
Arc configuration variant (from object):
krypton calibration lamp
N4 filter
1.2822 cvf wavelength
ND_STARE Acquisition configuration
0.5000 exposure time
10 exposures/integ
3 integrations
Setting up CGS4 for a Flat Field observation or for an Arc
observation requires further parameters to be specified in the CONFIG file
. These parameters are, for a Flat Field observation: the
flat sampling
, the flat lamp to be used, the
flat acquisition mode, the integration exposure time in
seconds, the number of exposures per integration
and the number of integrations per observation; for an
Arc observation: the required arc lamp, the echelle
arc CVF wavelength (if the echelle is the grating to be used),
the arc acquisition mode, the exposure time of
one integration in seconds, the number of exposures per
integration and finally the number of integrations per
observation.